Design of testability for analogue fault diagnosis

DOI10.1002/CTA.4490150204zbMath0631.94023OpenAlexW1977668453MaRDI QIDQ3768817

Chin-Long Wey

Publication date: 1987

Published in: International Journal of Circuit Theory and Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1002/cta.4490150204

zbMATH Keywords

fault locationdiagnosable circuitpseudo-circuit generationtestability condition

Mathematics Subject Classification ID

Analytic circuit theory (94C05)

Related Items (1)

Fault diagnosis under a limited-fault assumption and limited test-point availability

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