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Iddq testing-based diagnosis of faults in CMOS-circuits - MaRDI portal

Iddq testing-based diagnosis of faults in CMOS-circuits

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Publication:378377

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zbMath1274.94165MaRDI QIDQ378377

Yu. V. Bykov, V. N. Yarmolik, A. A. Ivanyuk, A. I. Yanushkevich

Publication date: 11 November 2013

Published in: Automation and Remote Control (Search for Journal in Brave)

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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