Iddq testing-based diagnosis of faults in CMOS-circuits
From MaRDI portal
Publication:378377
zbMath1274.94165MaRDI QIDQ378377
Yu. V. Bykov, V. N. Yarmolik, A. A. Ivanyuk, A. I. Yanushkevich
Publication date: 11 November 2013
Published in: Automation and Remote Control (Search for Journal in Brave)
This page was built for publication: Iddq testing-based diagnosis of faults in CMOS-circuits