A type-II censored, log test time based, component-testing procedure for a parallel system

DOI10.1109/24.9849zbMath0657.90042OpenAlexW2161827937MaRDI QIDQ3806965

Jayant Rajgopal, Mainak Mazumdar

Publication date: 1988

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.9849

zbMATH Keywords

system reliabilitytype-II censoringparallel systemconsumer riskproducer riskcomponent testingapproximate proceduresacceptance testingconstant failure ratesminimum-cost component-testing plans

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Reliability, availability, maintenance, inspection in operations research (90B25)

Related Items (6)

Optimum attributes component test plans for \(k\)-out-of-\(n:F\) Weibull systems using prior information ⋮ Construction of optimal reliability test plans for multi-state coherent systems of type 1 ⋮ Construction of optimal reliability test plans for binary type multi-state strongly coherent systems ⋮ Optimal component test plans for a parallel system based on type-II censoring ⋮ Application of Arithmetic-Geometric Mean Inequality for Construction of Reliability Test Plan for Parallel Systems in the Presence of Covariates ⋮ Design of component reliability test plan for a series system having time dependent testing cost with the presence of covariates

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