Characterizations of Gamma and negative binomial distributions (reliability application)

DOI10.1109/24.9843zbMath0659.62017OpenAlexW2154960087MaRDI QIDQ3809018

XinXiang Li, Shunji Osaki

Publication date: 1988

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.9843

zbMATH Keywords

conditional expectationfailure rategamma distributionnegative binomial distributionsCharacterizationsmean residual-life

Mathematics Subject Classification ID

Characterization and structure theory of statistical distributions (62E10) Reliability and life testing (62N05)

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