Theory of Cyclotron Resonance in Strained Silicon Crystals
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Publication:3844400
DOI10.1103/PHYSREV.129.1029zbMath0108.23504OpenAlexW2038331680WikidataQ128524002 ScholiaQ128524002MaRDI QIDQ3844400
Publication date: 1963
Published in: Physical Review (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1103/physrev.129.1029
Related Items (2)
The inhomogeneous strain distributions within finite cylinders under the axial point load tests and the effects on the valence band of \(Si_{1 - x}Ge_x\) alloy ⋮ Cyclotron Resonance Experiments in Uniaxially Stressed Silicon: Valence Band Inverse Mass Parameters and Deformation Potentials
Cites Work
- Quantum Theory of Cyclotron Resonance in Semiconductors: General Theory
- Application of the Orthogonalized Plane-Wave Method to Silicon Crystal
- Theory of Electron-Phonon Interactions
- Cyclotron Resonance Experiments in Uniaxially Stressed Silicon: Valence Band Inverse Mass Parameters and Deformation Potentials
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