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Transient Analysis and Device Characterization of ACP Circuits - MaRDI portal

Transient Analysis and Device Characterization of ACP Circuits

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Publication:3849240

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DOI10.1147/RD.73.0207zbMath0112.08401OpenAlexW1981332156MaRDI QIDQ3849240

K. G. Ashar, H. Ghosh, L. J. Patterson, A. W. Aldridge

Publication date: 1963

Published in: IBM Journal of Research and Development (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1147/rd.73.0207

zbMATH Keywords

numerical analysis

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