A Pattern Deformational Model and Bayes Error-Correcting Recognition System

DOI10.1109/TSMC.1979.4310126zbMath0422.68041MaRDI QIDQ3856122

King-Sun Fu, Wen-Hsiang Tsai

Publication date: 1979

Published in: IEEE Transactions on Systems, Man, and Cybernetics (Search for Journal in Brave)

zbMATH Keywords

pattern classificationBayes error-correcting parsing algorithmspattern deformational modelsemantic deformationsyntactic deformation

Mathematics Subject Classification ID

Classification and discrimination; cluster analysis (statistical aspects) (62H30) Pattern recognition, speech recognition (68T10) Artificial intelligence (68T99)

Related Items (3)

Optimal matching of deformed patterns with positional influence ⋮ Efficient error-correcting parsing for (attributed and stochastic) tree grammars ⋮ Bayes' error and its sensitivity in statistical pattern recognition in noisy environment

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