Functional Level Primitives in Test Generation
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Publication:3869270
DOI10.1109/TC.1980.1675554zbMath0431.94053OpenAlexW1996682897MaRDI QIDQ3869270
Arthur D. Friedman, Melvin A. Breuer
Publication date: 1980
Published in: IEEE Transactions on Computers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tc.1980.1675554
fault detectionfault diagnosistest sequencesfunctional test generationcomplex sequential circuitsfunctional level modeling
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