Testing Memories for Single-Cell Pattern-Sensitive Faults

DOI10.1109/TC.1980.1675556zbMath0431.94054OpenAlexW1975733849MaRDI QIDQ3869271

John P. Hayes

Publication date: 1980

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1980.1675556

zbMATH Keywords

fault detectiontest generationpolyominoesmemory testingdesign of minimum-length test sequencespattern-sensitive faultrandom-access memory arrays

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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