Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis

DOI10.1109/TC.1980.1675604zbMath0436.94035OpenAlexW1907242073MaRDI QIDQ3877570

Miron Abramovici, Melvin A. Breuer

Publication date: 1980

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1980.1675604

zbMATH Keywords

fault diagnosiscombinational networksmultiple stuck-at faultsdeduction of internal valueseffect-cause analysismultiple redundant faults

Mathematics Subject Classification ID

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