Design of Self-Checking MOS-LSI Circuits: Application to a Four-Bit Microprocessor

DOI10.1109/TC.1980.1675615zbMath0436.94038OpenAlexW1785177721MaRDI QIDQ3877575

Christian Landrault, Yves Crouzet

Publication date: 1980

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1980.1675615

zbMATH Keywords

fault detectionself-checkingMOS-LSI circuits

Mathematics Subject Classification ID

Related Items (1)

Techniques for efficiently implementing totally self-checking checkers in MOS technology

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