Test Generation for Microprocessors
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Publication:3877584
DOI10.1109/TC.1980.1675602zbMath0436.94044OpenAlexW1823755974MaRDI QIDQ3877584
Satish M. Thatte, Jacob A. Abraham
Publication date: 1980
Published in: IEEE Transactions on Computers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tc.1980.1675602
test programsmicroprocessor architecturecomplexity of testsarchitecture modelsfunctional level fault models
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Related Items (3)
Functional test generation using binary decision diagrams ⋮ A systematic technique for detecting and locating bridging and stuck-at faults in I/O pins of LSI/VLSI chips ⋮ Testing diagnostics of modern microprocessors with the use of functional models
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