The Relationship of the Bayes Risk to Certain Separability Measures in Normal Classification

DOI10.1109/TPAMI.1980.4766987zbMath0444.62071OpenAlexW1982187725WikidataQ52765464 ScholiaQ52765464MaRDI QIDQ3888369

Marvin Yablon, John T. Chu

Publication date: 1980

Published in: IEEE Transactions on Pattern Analysis and Machine Intelligence (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tpami.1980.4766987

zbMATH Keywords

pattern recognitiondivergenceerror probabilityBhattacharyya distanceminimum Bayes riskChernoff boundMatusita distanceseparability measuresKolmogorov's variational distancemultivariate normal classification

Mathematics Subject Classification ID

Classification and discrimination; cluster analysis (statistical aspects) (62H30) Bayesian inference (62F15)

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