Yield maximization and worst-case design with arbitrary statistical distributions

DOI10.1109/TCS.1980.1084889zbMath0447.94059OpenAlexW2132245445MaRDI QIDQ3893861

Stephen W. Director, Gary D. Hachtel, Robert K. Brayton

Publication date: 1980

Published in: IEEE Transactions on Circuits and Systems (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tcs.1980.1084889

zbMATH Keywords

yield maximizationlinear programstatistical designworst-case designsimplicial approximation

Mathematics Subject Classification ID

Applications of design theory to circuits and networks (94C30)

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The \(C_ M\)-embedded problem and optimality conditions ⋮ The use of stochastic analytic center for yield maximization of systems with general distributions of component values

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