On Closedness and Test Complexity of Logic Circuits

DOI10.1109/TC.1981.1675840zbMath0461.94019MaRDI QIDQ3912732

Hideo Fujiwara

Publication date: 1981

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

zbMATH Keywords

fault diagnosislogic functionsuniversal test setsstuck faults

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Switching theory, applications of Boolean algebras to circuits and networks (94C11)

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