Effects of manufacturing defects on the device failure rate

DOI10.1016/j.jkss.2013.02.003zbMath1294.90021OpenAlexW1965029180MaRDI QIDQ395910

Kyungmee O. Kim

Publication date: 7 August 2014

Published in: Journal of the Korean Statistical Society (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.jkss.2013.02.003

zbMATH Keywords

reliabilitydefect clusteringdefect growthinfant mortality failures

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

Related Items (1)

Evaluating the failure risk with and without failure data

Cites Work

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