Asymptotic efficiencies of truncated sequential tests

DOI10.1109/TIT.1982.1056578zbMath0497.62073OpenAlexW2033391107MaRDI QIDQ3962368

Sawasd Tantaratana, H. Vincent Poor

Publication date: 1982

Published in: IEEE Transactions on Information Theory (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tit.1982.1056578

zbMATH Keywords

average sample sizeasymptotic efficienciestruncated sequential testsprobability ratio testtesting location parameter

Mathematics Subject Classification ID

Sequential statistical analysis (62L10)

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Truncated sequential CFAR detectors using weighted sign and weighted conditional sign tests ⋮ A class of truncated sequential nonparametric tests with constant boundaries: Design and Performance ⋮ Acquisition of PN sequences for DS/SS systems using a truncated sequential probability ratio test

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