Tests for Many Outliers in an Exponential Sample

DOI10.2307/2348000zbMath0501.62077OpenAlexW2797454582MaRDI QIDQ3966967

Alan C. Kimber

Publication date: 1982

Published in: Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.2307/2348000

zbMATH Keywords

tablesexponential distributioncritical valuessensitivity contourstests for many outliers

Mathematics Subject Classification ID

Sequential statistical analysis (62L10)

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