Optimum simple step-stress accelerated life-tests with competing causes of failure

DOI10.1109/24.106787zbMath0736.62083OpenAlexW2115913995MaRDI QIDQ3987537

Do Sun Bai, Y. R. Chun

Publication date: 28 June 1992

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.106787

zbMATH Keywords

Fisher informationasymptotic variancemaximum likelihoodcumulative exposure modelcompeting causes of failureexponential life distributionoptimum simple step-stress accelerated life-tests

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Related Items (11)

Analysis of simple step-stress accelerated life test data from Lindley distribution under type-I censoring ⋮ Reliability model for dual constant-stress accelerated life test with Weibull distribution under Type-I censoring scheme ⋮ Accelerated life test planning with independent lognormal competing risks ⋮ Inference and Optimal Design Based on Step—Partially Accelerated Life Tests for the Generalized Pareto Distribution under Progressive Type-I Censoring ⋮ Classical and Bayesian inference for an extended generalized Birnbaum-Saunders distribution ⋮ Optimal step-stress test under type-I censoring for multivariate exponential distribution ⋮ Inference for a progressive stress model from Weibull distribution under progressive type-II censoring ⋮ Step partially accelerated life tests under finite mixture models ⋮ Equivalent accelerated life testing plans for log-location-scale distributions ⋮ Planning accelerated life tests for censored two-parameter exponential distributions ⋮ Optimal design of accelerated life testing plans for periodical replacement with penalty

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