Super-resolution in confocal scanning microscopy: IV. Theory of data inversion by the use of optical masks

DOI10.1088/0266-5611/8/1/001zbMath0782.65151OpenAlexW2093316196MaRDI QIDQ3991772

R. E. Davies, P. Boccacci, J. G. Walker, R. E. Malfanti, E. R. Pike, Mario Bertero

Publication date: 28 June 1992

Published in: Inverse Problems (Search for Journal in Brave)

Full work available at URL: https://semanticscholar.org/paper/9568bca7570e070d1e7ff555be955f206e43d15e

zbMATH Keywords

numerical resultssuper-resolutiondata inversionresolution improvementnumerical apertureconfocal scanning microscopysingular-system analysisoptical mask

Mathematics Subject Classification ID

Numerical methods for integral equations (65R20) Signal theory (characterization, reconstruction, filtering, etc.) (94A12) Technical applications of optics and electromagnetic theory (78A55) Integral equations of the convolution type (Abel, Picard, Toeplitz and Wiener-Hopf type) (45E10) Geometric optics (78A05)

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