scientific article

zbMath0752.94020MaRDI QIDQ4002329

Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell

Publication date: 18 September 1992

Title: zbMATH Open Web Interface contents unavailable due to conflicting licenses.

zbMATH Keywords

NP-complete problemsneural modelsQuadratic 0-1 programmingdigital logic circuitsdigital testingHopfield energy functionneural networks massive parallelismtest generation problem

Mathematics Subject Classification ID

Learning and adaptive systems in artificial intelligence (68T05) Neural networks for/in biological studies, artificial life and related topics (92B20) Research exposition (monographs, survey articles) pertaining to information and communication theory (94-02) Detection theory in information and communication theory (94A13) Fault detection; testing in circuits and networks (94C12)

Related Items (2)

APPLYING QUANTUM SEARCH TO AUTOMATED TEST PATTERN GENERATION FOR VLSI CIRCUITS ⋮ An application of Hopfield networks to worst-case power analysis of RT-level VLSI systems

This page was built for publication: