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Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring - MaRDI portal

Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring

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Publication:4015212

DOI10.1109/24.159807zbMath0749.62063OpenAlexW2138542818MaRDI QIDQ4015212

No author found.

Publication date: 14 December 1992

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.159807




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