Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
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Publication:4080622
DOI10.2307/1267923zbMath0318.62081OpenAlexW1988343734MaRDI QIDQ4080622
Wayne Nelson, Thomas J. Kielpinski
Publication date: 1976
Published in: Technometrics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.2307/1267923
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Planning accelerated life tests for selecting the most reliable product ⋮ Optimal design of accelerated life tests under modified stress loading methods ⋮ Optimal Allocation for Extreme Value Regression Under Time Censoring ⋮ Accelerated life test planning with independent lognormal competing risks ⋮ Investigating design for survival models ⋮ Optimal sample size allocation for accelerated life test under progressive type-II censoring with competing risks ⋮ Estimating and planning accelerated life test using constant stress for generalized logistic distribution under type-I censoring ⋮ Bayesian planning of optimal step-stress accelerated life test for log-location-scale distributions ⋮ Planning step-stress test plans under type-I hybrid censoring for the log-location-scale distribution ⋮ Optimal designs for accelerated life tests with multiple stress factors and heteroscedasticity ⋮ Optimal sample size allocation for multi-level stress testing with Weibull regression under Type-II censoring ⋮ Planning Accelerated Life Tests Under Progressive Type I Interval Censoring with Random Removals ⋮ Bayesian design for accelerated life testing ⋮ Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor ⋮ Equivalent accelerated life testing plans for log-location-scale distributions ⋮ Planning accelerated life tests for censored two-parameter exponential distributions ⋮ Optimal design of accelerated life testing plans for periodical replacement with penalty ⋮ A survey of covariance models for censored life data with an application to recidivism analysis ⋮ Design of accelerated life test sampling plans with a nonconstant shape parameter ⋮ Optimum step‐stress accelerated life test plans for log‐location‐scale distributions ⋮ A dynamic bayesian approach to inference from accelerated life tests
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