A Nine-Valued Circuit Model for Test Generation

DOI10.1109/TC.1976.1674663zbMath0327.94041MaRDI QIDQ4093344

Peter Muth

Publication date: 1976

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

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Maxx: Test pattern optimisation with local search over an extended logic ⋮ Forecasting the efficiency of test generation algorithms for combinational circuits

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