Cost-Optimized Burn-In Duration for Repairable Electronic Systems

DOI10.1109/TR.1977.5220114zbMath0368.90066MaRDI QIDQ4145111

Thomas O. Field, Kenneth T. Plesser

Publication date: 1977

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

Related Items (2)

Determination of the optimal accelerated burn-in time under Arrhenius-log normal distribution assumption ⋮ Optimal burn-in time to minimize the cost for general repairable products sold under warranty

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