Tolerance Limits and Confidence Limits on Reliability for the Two-Parameter Exponential Distribution

DOI10.2307/1268159zbMath0371.62140OpenAlexW4246509541MaRDI QIDQ4147534

Maxwell Eugene Engelhardt, Lee J. Bain

Publication date: 1978

Full work available at URL: https://doi.org/10.2307/1268159

Mathematics Subject Classification ID

Reliability and life testing (62N05)

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