Patterns in Residuals in the Two-Way Layout
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Publication:4185679
DOI10.2307/1267638zbMath0401.62056OpenAlexW4248700291MaRDI QIDQ4185679
Publication date: 1978
Full work available at URL: https://doi.org/10.2307/1267638
Analysis of VariancePattern RecognitionInteractionsResidualsNonadditivityFactorial RepresentationTwo-Way Layout
Classification and discrimination; cluster analysis (statistical aspects) (62H30) Applications of statistics (62P99) Analysis of variance and covariance (ANOVA) (62J10)
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