On the Design of Easily Testable Iterative Systems of Combinational Cells
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Publication:4194877
DOI10.1109/TC.1979.1675368zbMath0407.94017OpenAlexW2145473189MaRDI QIDQ4194877
Publication date: 1979
Published in: IEEE Transactions on Computers (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tc.1979.1675368
Low Single Fault Stuck-At Fault Test ComplexityNormalform CircuitNormalform DesignOne-Dimensional Iterative Systems of Combinational CellsRealization of the Cell Function
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