Software-reliability growth with a Weibull test-effort: a model and application

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Publication:4202510

DOI10.1109/24.210278zbMath0775.90200OpenAlexW2112333328MaRDI QIDQ4202510

Jun Hishitani, Shigeru Yamada, Shunji Osaki

Publication date: 4 October 1993

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.210278




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