Generalized beta prior models on fraction defective in reliability test planning

DOI10.1016/j.cam.2012.02.012zbMath1238.62123OpenAlexW2043576603MaRDI QIDQ421820

Carlos J. Pérez-González, Arturo J. Fernández

Publication date: 14 May 2012

Published in: Journal of Computational and Applied Mathematics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.cam.2012.02.012

zbMATH Keywords

quantilesshifted exponential distributionaverage consumer riskaverage producer riskmaximum entropy priorreliability demonstration sampling plan

Mathematics Subject Classification ID

Related Items (14)

Optimum attributes component test plans for \(k\)-out-of-\(n:F\) Weibull systems using prior information ⋮ Minimizing the area of a Pareto confidence region ⋮ Balancing producer and consumer risks in optimal attribute testing: a unified Bayesian/frequentist design ⋮ Optimal lot sentencing based on defective counts and prior acceptability ⋮ Optimal truncated repetitive lot inspection with defect rates ⋮ Computing tolerance limits for the lifetime of a \(k\)-out-of-\(n\):\(F\) system based on prior information and censored data ⋮ Economic lot sampling inspection from defect counts with minimum conditional value-at-risk ⋮ Computing optimal confidence sets for Pareto models under progressive censoring ⋮ Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis ⋮ Efficient truncated repetitive lot inspection using Poisson defect counts and prior information ⋮ Explicit quasi-optimal inspection schemes from nonconformity count data with controlled producer and consumer risks ⋮ Controlling posterior producer and consumer risks in lot reinspection ⋮ Optimal lot disposition from Poisson-Lindley count data ⋮ Best prediction regions for future exponential record intervals

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