A boundary element analysis of magnetic shielding for electron microscopes
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Publication:4255036
DOI10.1108/03321649810220883zbMath0935.78016OpenAlexW2089603379MaRDI QIDQ4255036
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Publication date: 9 August 1999
Published in: COMPEL - The international journal for computation and mathematics in electrical and electronic engineering (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1108/03321649810220883
Boundary element methods applied to problems in optics and electromagnetic theory (78M15) Electron optics (78A15)
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