Optimal design of accelerated life tests under modified stress loading methods
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Publication:4266302
DOI10.1080/02664769823296zbMath0935.62116OpenAlexW1969798152MaRDI QIDQ4266302
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Publication date: 8 May 2000
Published in: Journal of Applied Statistics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/02664769823296
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Cites Work
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- Optimum simple ramp-tests for the Weibull distribution and type-I censoring
- Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
- Optimum Accelerated Life Tests with a Nonconstant Scale Parameter
- Optimal design of accelerated life tests under periodic inspection
- Accelerated life test plans under intermittent inspection and type-I censoring: The case of weibull failure distribution
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