Tightened single-level continuous sampling plan

DOI10.1080/02664769822945zbMath0934.62123OpenAlexW2045099837MaRDI QIDQ4266317

S. Balamurali, Kameswararao V. Govindaraju

Publication date: 30 September 1999

Published in: Journal of Applied Statistics (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/02664769822945

zbMATH Keywords

quality control

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Applications of Markov chains and discrete-time Markov processes on general state spaces (social mobility, learning theory, industrial processes, etc.) (60J20)

Related Items (4)

Minimum average fraction inspected for TCSP-1 plan ⋮ On the modes of the negative binomial distribution of order k, type I ⋮ On the modes of the negative binomial distribution of order k ⋮ Optimal scheme for process quality and cost control by integrating a continuous sampling plan and the process yield index

Cites Work

• Tightened Multi-Level Continuous Sampling Plans
• A Sampling Inspection Plan for Continuous Production
• Multi-Level Continuous Sampling Plans

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