Coincidence of two failure rate models

DOI10.1080/03610929308831055zbMath0800.62597OpenAlexW2080184617MaRDI QIDQ4275802

Seiji Nabeya

Publication date: 20 January 1994

Published in: Communications in Statistics - Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610929308831055

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Related Items (1)

Conditions for the coincidence of the TFR, TRV and CE models

Cites Work

• Unnamed Item
• A tampered failure rate model for step-stress accelerated life test
• Bayesian estimation and optimal designs in partially accelerated life testing
• Accelerated Life Testing - Step-Stress Models and Data Analyses

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