Optimum Accelerated Life Tests with a Nonconstant Scale Parameter
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Publication:4292173
DOI10.2307/1269200zbMath0800.62624OpenAlexW4247181804MaRDI QIDQ4292173
Carol A. Meeter, William Q. Meeker
Publication date: 1 June 1994
Published in: Technometrics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.2307/1269200
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Optimal design of accelerated life tests under modified stress loading methods ⋮ Estimation of exponential population with nonconstant parameters under constant-stress model ⋮ Estimation of constant-stress accelerated life test for Weibull distribution with nonconstant shape parameter ⋮ Bayesian optimum accelerated life test plans based on quantile regression ⋮ Inference for constant-stress Weibull competing risks model under generalized progressive hybrid censoring ⋮ A general threshold stress hybrid hazard model for lifetime data ⋮ Diagnostic analysis for heterogeneous log-Birnbaum-Saunders regression models ⋮ The step-stress tampered failure rate model under interval monitoring ⋮ Optimal designs for accelerated life tests with multiple stress factors and heteroscedasticity ⋮ Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor ⋮ Equivalent accelerated life testing plans for log-location-scale distributions ⋮ Adjusted empirical likelihood models with estimating equations for accelerated life tests ⋮ Bayesian inference for polyhazard models in the presence of covariates. ⋮ Inference of constant-stress accelerated life test for a truncated distribution under progressive censoring ⋮ Influence diagnostics for polyhazard models in the presence of covariates ⋮ Optimal design of accelerated life testing plans for periodical replacement with penalty ⋮ Design of accelerated life test sampling plans with a nonconstant shape parameter ⋮ Optimal designs for step-stress models under interval censoring ⋮ Inference of accelerated dependent competing risks model for Marshall-Olkin bivariate Weibull distribution with nonconstant parameters ⋮ Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data
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