Automatically generating test data from a Boolean specification
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Publication:4302742
DOI10.1109/32.286420zbMath0809.94036OpenAlexW2100425664MaRDI QIDQ4302742
Elaine J. Weyuker, Ashutosh Singh, Tarak Goradia
Publication date: 21 August 1994
Published in: IEEE Transactions on Software Engineering (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/32.286420
Fault detection; testing in circuits and networks (94C12) Specification and verification (program logics, model checking, etc.) (68Q60)
Related Items (4)
MC/DC test cases generation based on BDDs ⋮ Automatically generating test data from a Boolean specification ⋮ Test-data generation for control coverage by proof ⋮ Generation of mutants for boolean expression
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