Reliability of 2-dimensional consecutive-k-out-of-n:F systems

DOI10.1109/24.273602zbMath0799.60088OpenAlexW2084802219MaRDI QIDQ4303740

Markos V. Koutras, George K. Papadopoulos, Stavros G. Papastavridis

Publication date: 17 November 1994

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.273602

zbMATH Keywords

reliability boundsconsecutive \(k\)-out-of-\(n:F\) systemWeibull limit theorem

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Applications of renewal theory (reliability, demand theory, etc.) (60K10)

Related Items (12)

Compound Poisson approximation: A user's guide ⋮ Poisson approximations for 2-dimensional patterns ⋮ Reliability lower bounds for two-dimensional consecutive-\(k\)-out-of-\(n\): F systems ⋮ Two-dimensional discrete scan statistics ⋮ Bounds for coherent reliability structures ⋮ Acceptance testing for a planar array ⋮ Approximations of distributions of scan statistics of inhomogeneous Poisson processes ⋮ Approximations for a three dimensional scan statistic ⋮ A formula for the reliability of a \(d\)-dimensional consecutive-\(k\)-out-of-\(n\):F system ⋮ A reliability bound for 2-dimensional consecutive k-out-of-n: F systems ⋮ Discrete, Continuous and Conditional Multiple Window Scan Statistics ⋮ Approximations for a conditional two-dimensional scan statistic.

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