Error Estimates for a Finite Element Method for the Drift-Diffusion Semiconductor Device Equations: The Zero Diffusion Case
DOI10.2307/2153562zbMath0806.65129OpenAlexW2024857802MaRDI QIDQ4305983
Ioanna Triandaf, Bernardo Cockburn
Publication date: 9 February 1995
Full work available at URL: https://doi.org/10.2307/2153562
error estimatesfinite element methodconservation lawsdrift-diffusion semiconductor device equationszero-diffusion unipolar model
PDEs in connection with optics and electromagnetic theory (35Q60) Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs (65M60) Technical applications of optics and electromagnetic theory (78A55) Applications to the sciences (65Z05)
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Cites Work
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