Error Estimates for a Finite Element Method for the Drift Diffusion Semiconductor Device Equations

DOI10.1137/0731056zbMath0804.65128OpenAlexW2007728604MaRDI QIDQ4307033

Zhang-Xin Chen, Bernardo Cockburn

Publication date: 26 September 1994

Published in: SIAM Journal on Numerical Analysis (Search for Journal in Brave)

Full work available at URL: https://semanticscholar.org/paper/342a40fcd8a8dfca0c17b604ca77410c2eb70d63

zbMATH Keywords

error estimatesmixed finite element methoddrift-diffusion semi-conductor device equationsunipolar modelupwinding finite element method

Mathematics Subject Classification ID

PDEs in connection with optics and electromagnetic theory (35Q60) Hyperbolic conservation laws (35L65) Finite element, Galerkin and related methods applied to problems in optics and electromagnetic theory (78M10) Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs (65M60) Technical applications of optics and electromagnetic theory (78A55) Error bounds for initial value and initial-boundary value problems involving PDEs (65M15) Applications to the sciences (65Z05)

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