Design of sequential sampling inspection plans with screening based on minimal lattice paths

DOI<link itemprop=identifier href="https://doi.org/10.1002/1520-6750(199412)41:7<991::AID-NAV3220410710>3.0.CO;2-2" /><991::AID-NAV3220410710>3.0.CO;2-2 10.1002/1520-6750(199412)41:7<991::AID-NAV3220410710>3.0.CO;2-2zbMath0842.90046OpenAlexW2047596723MaRDI QIDQ4319225

Ikuo Arizono, Hiroshi Ohta

Publication date: 11 January 1995

Full work available at URL: https://doi.org/10.1002/1520-6750(199412)41:7<991::aid-nav3220410710>3.0.co;2-2

zbMATH Keywords

screeningsequential sampling plansminimal lattice paths

Mathematics Subject Classification ID

Applications of statistics in engineering and industry; control charts (62P30) Sampling theory, sample surveys (62D05) Reliability, availability, maintenance, inspection in operations research (90B25)

Cites Work

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