An Image Analysis Problem in Electron Microscopy

DOI10.2307/2291713zbMath0882.62093OpenAlexW4250523298MaRDI QIDQ4365987

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Publication date: 5 March 1998

Full work available at URL: https://doi.org/10.2307/2291713

zbMATH Keywords

electron microscopyimage restorationMarkov random fieldsiterative conditional modes

Mathematics Subject Classification ID

Random fields; image analysis (62M40) Applications of statistics (62P99) Survival analysis and censored data (62N99)

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