Statistical Inference of a Time-to-Failure Distribution Derived from Linear Degradation Data
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Publication:4369986
DOI10.2307/1271503zbMath0935.62114OpenAlexW2029196878MaRDI QIDQ4369986
Qing Yang, Jye-Chyi Lu, Jin-Ho Park
Publication date: 8 May 2000
Full work available at URL: https://doi.org/10.2307/1271503
reliabilitylikelihood ratio testrandom coefficientsbootstrap confidence intervalsemiconductor degradationstandard-deviation function
Applications of statistics in engineering and industry; control charts (62P30) Reliability and life testing (62N05)
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