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Exhaustive testing of almost all devices with outputs depending on limited number of inputs

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Publication:4391010
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DOI10.1007/BF02228856zbMath1037.94561MaRDI QIDQ4391010

Lev B. Levitin, Mark G. Karpovsky

Publication date: 1994

Published in: Open Systems & Information Dynamics (Search for Journal in Brave)



Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Specification and verification (program logics, model checking, etc.) (68Q60)




Cites Work

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  • A polynomial algorithm for constructing families of k-independent sets
  • Families of finite sets in which no set is covered by the union of two others
  • Intersections of k-element sets
  • Families of \(k\)-independent sets
  • A decomposition theorem for partially ordered sets
  • Design of universal test sequences for VLSI
  • Polynomially Complete Fault Detection Problems
  • A short proof of Sperner's lemma
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