Electrical resistance tomography for locating inclusions using analytical boundary element integrals and their partial derivatives
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Publication:441681
DOI10.1016/j.enganabound.2010.05.008zbMath1244.78035OpenAlexW2077488247MaRDI QIDQ441681
Feng Dong, Chao Tan, Yaoyuan Xu
Publication date: 7 August 2012
Published in: Engineering Analysis with Boundary Elements (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.enganabound.2010.05.008
boundary element methodLevenberg-Marquardt methodcomplete electrode modelelectrical resistance tomography
Technical applications of optics and electromagnetic theory (78A55) Boundary element methods applied to problems in optics and electromagnetic theory (78M15)
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