A fast method to evaluate the optimum number of spares in defect-tolerant integrated circuits

DOI10.1109/12.286302zbMath1042.68529OpenAlexW2133384945MaRDI QIDQ4420047

Claude Thibeault, Yvon Savaria, J. L. Houle

Publication date: 1994

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/12.286302

zbMATH Keywords

prediction methodoptimum redundancyyielding modeling

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

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