On the use of counters for reproducing deterministic test sets

DOI10.1109/12.545970zbMath1057.68530OpenAlexW2129821805MaRDI QIDQ4420787

Amitava Majumdar, Dimitrios Kagaris, Spyros Tragoudas

Publication date: 1996

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/12.545970

zbMATH Keywords

test pattern generationbinary counterbinary matrix column perturbation

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

Related Items (1)

Computational analysis of counter-based schemes for VLSI test pattern generation

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