Theory of transparent BIST for RAMs

DOI10.1109/12.543708zbMath1057.68613OpenAlexW2109007518MaRDI QIDQ4420831

Michael Nicolaidis

Publication date: 1996

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/12.543708

zbMATH Keywords

signature analysisRAM test algorithms

Mathematics Subject Classification ID

Data encryption (aspects in computer science) (68P25)

Related Items (2)

The repeated nondestructive march tests with variable address sequences ⋮ Analysis of multibackground memory testing techniques

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