Multiple fault detection in fan-out free circuits using minimal single fault test set

DOI10.1109/12.506433zbMath1049.68517OpenAlexW2119873534MaRDI QIDQ4420990

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Publication date: 1996

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/12.506433

zbMATH Keywords

test generation

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12) Reliability, testing and fault tolerance of networks and computer systems (68M15)

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