Modeling electrostatic force microscopy for conductive and dielectric samples using the boundary element method

DOI10.1016/j.enganabound.2007.12.003zbMath1244.78032OpenAlexW2079352323MaRDI QIDQ443314

J. Herrera, H. S. Yoon

Publication date: 7 August 2012

Published in: Engineering Analysis with Boundary Elements (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.enganabound.2007.12.003

zbMATH Keywords

boundary element methodatomic force microscopyimage charge methodelectrostatic force microscopyimplicit differentiation methodMaxwell stress tensor

Mathematics Subject Classification ID

Technical applications of optics and electromagnetic theory (78A55) Boundary element methods applied to problems in optics and electromagnetic theory (78M15) Electro- and magnetostatics (78A30)

Cites Work

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