Wavelet-based approach for ball grid array (BGA) substrate conduct paths inspection

DOI10.1080/00207540110049737zbMath1175.90130OpenAlexW2152370848MaRDI QIDQ4443356

Du-Ming Tsai, Chi-Hao Yeh

Publication date: 11 January 2004

Published in: International Journal of Production Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207540110049737

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

Related Items (3)

Image denoising based on edge detection and prethresholding Wiener filtering of multi-wavelets fusion ⋮ Non-referential, self-compared shape defect inspection for bond pads with deformed shapes ⋮ Ball grid array (BGA) substrate conduct paths inspection using two-dimensional wavelet transform

Cites Work

• The wavelet transform, time-frequency localization and signal analysis
• Ten Lectures on Wavelets
• Boundary-based corner detection using eigenvalues of covariance matrices
• Unnamed Item
• Unnamed Item

This page was built for publication: Wavelet-based approach for ball grid array (BGA) substrate conduct paths inspection